Testing, Visual, and Shipping Standards

Manufactured and frequency tested to tolerance of 0.0215f^2, unless noted otherwise.

Optional sorting into frequency groups - contact sales

Center 60% of Mesa to be free of all defects of scratches, etch channel defects, pits, or bubbles.

Cleaned and shipped in XECO Waffle packs (vacuum packed)

Manufactured and frequency tested to tolerance of 0.12f^2.  Devices are sorted by frequency for shipping

Center 50% of Mesa to be free of all defects of scratches, etch channel defects, pits, or bubbles.

Each lot Cleaned, frequency sorted, and sequentially placed into XECO waffle packs (vacuum packed)

Oscillator and VCXO crystals are screened to the datasheet min/max limits for frequency,  ESR,  and spurious modes. C1, C0, L, Q  may be used as screening criteria based on application requirements.  (For example C0/C1 ratio for VCXO may be tested, or C0 maximum for XO overtone crystal)

Corporate minimum for spurious mode performance on any crystal shipped is as follows:

Filter and Sensor Crystals = customer specified

Oscillator crystals -4dB maximum @ 0pf CL

VCXO crystals -6dB maximum @ 0pf CL

Refer to datasheets or characterization data for actual performance; most devices have substantially better  (lower) spurious mode performance.  Specific part types may have different or more stringent requirements, including different limits, testing at specific CL capacitive loads, or testing based on peak resistance ratios

Testing Standards applied are IEC444; see Testing to Specifications for more information

Visual criteria per plated crystals  final inspection specification.

30X magnification with lighting adjusted to show surface well.

No particles >0.5micron allowed.

Maximum count on electrodes <0.5 micron = 4)

Full details specification  XECO 9015 final inspection

Cleaned, and dried, and packed in XECO waffle packs. vacuum packed and ready to open in clean area for direct assembly/mounting in packages.