| Crystal Blanks - except X5024, Z5024 |
Manufactured and frequency tested to tolerance of
0.0215f^2, unless noted otherwise.
Optional sorting into frequency groups -
contact sales
|
Center 60% of Mesa to be free of all defects of
scratches, etch channel defects, pits, or bubbles. |
Cleaned and shipped in XECO Waffle packs (vacuum packed) |
| Crystal Blanks - X5024 & Z5024 |
Manufactured and frequency tested to tolerance of
0.12f^2. Devices are sorted by frequency for shipping |
Center 50% of Mesa to be free of all defects of
scratches, etch channel defects, pits, or bubbles.
|
Each lot Cleaned, frequency sorted, and sequentially placed into
XECO waffle packs (vacuum packed) |
| Plated Crystals |
Oscillator and VCXO
crystals are screened to the datasheet min/max limits for frequency,
ESR, and spurious modes. C1, C0, L, Q may be used as screening
criteria based on application requirements. (For example C0/C1 ratio for
VCXO may be tested, or C0 maximum for XO overtone crystal)
Corporate minimum for
spurious mode performance on any crystal shipped is as follows:
Filter and Sensor
Crystals = customer specified
Oscillator crystals -4dB
maximum @ 0pf CL
VCXO crystals -6dB maximum
@ 0pf CL
Refer to datasheets or characterization data for actual performance;
most devices have substantially better (lower) spurious mode
performance. Specific part types may have different or more stringent
requirements, including different limits, testing at specific CL capacitive
loads, or testing based on peak resistance ratios
Testing Standards applied are IEC444; see
Testing to Specifications for more information
|
Visual criteria per plated crystals final
inspection specification.
30X magnification with lighting adjusted to show surface well.
No particles >0.5micron allowed.
Maximum count on electrodes <0.5 micron = 4)
Full details specification
XECO 9015 final inspection
|
Cleaned, and dried, and packed in XECO waffle packs. vacuum packed
and ready to open in clean area for direct assembly/mounting in packages.
|
